KLA, based in Milpitas, California, provides process control and yield management solutions for the semiconductor industry, employing 15,000 people. Its offerings include inspection, metrology products, and services for integrated circuit manufacturing.
KLAC filed a patent for "overlay metrology target for die-to-wafer overlay metrology" on Wed, January 24, 2024. The patent was officially published on Thu, February 13, 2025.
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