Camtek

Filed a patent for "method and system for classifying defects in wafer using wafer-defect images, based on deep learning" on Thu, August 29, 2024

Filed a patent for "semiconductor inspection tool system and method for wafer edge inspection" on Tue, December 13, 2022

Filed a patent for "bump measurement height metrology" on Thu, July 20, 2023

Filed a patent for "dark field illumination based on laser illuminated phosphor" on Thu, August 10, 2023

Filed a patent for "semiconductor inspection tool system and method for wafer edge inspection" on Thu, January 4, 2024

Filed a patent for "semiconductor edge and bevel inspection tool system" on Wed, July 12, 2023