Onto Innovation

Filed a patent for "log file aggregator and data visualization for semiconductor control systems" on Thu, January 30, 2025

Filed a patent for "photo response non-uniformity correction during semiconductor inspection" on Thu, January 2, 2025

Filed a patent for "surface roughness interferometer" on Thu, December 29, 2022

Filed a patent for "bell-crank assembly to provide directional motion" on Thu, October 26, 2023

Filed a patent for "tracking and/or predicting substrate yield during fabrication" on Tue, April 18, 2023

Filed a patent for "system and method for fast microscopy" on Fri, April 7, 2023

Filed a patent for "system and method for fast microscopy" on Thu, October 10, 2024

Filed a patent for "multi pump-probe encoding-decoding for opto-acoustic metrology" on Fri, March 31, 2023

Filed a patent for "multi pump-probe encoding-decoding for opto-acoustic metrology" on Thu, October 3, 2024

Filed a patent for "optical metrology with influence map of unknown section" on Fri, April 26, 2024

Filed a patent for "substrate edge patterning techniques" on Mon, March 20, 2023

Filed a patent for "transfer learning for metrology data analysis" on Wed, March 22, 2023

Filed a patent for "measurements of structures in presence of signal contaminations" on Thu, October 26, 2023

Filed a patent for "substrate edge patterning techniques" on Thu, September 26, 2024

Filed a patent for "transfer learning for metrology data analysis" on Thu, September 26, 2024

Filed a patent for "adaptive spatial pattern recognition for defect detection" on Thu, August 22, 2024

Filed a patent for "mask and procedure for process performance detection" on Thu, July 25, 2024

Filed a patent for "interferometer with auxiliary lens for measurement of a transparent test object" on Thu, August 8, 2024

Filed a patent for "adaptive spatial pattern recognition for defect detection" on Fri, February 17, 2023

Filed a patent for "overlay correction for advanced integrated-circuit devices" on Thu, December 29, 2022

Filed a patent for "overlay correction for advanced integrated-circuit devices" on Thu, July 4, 2024

Filed a patent for "parameter aggregation and normalization for manufacturing tools" on Thu, September 15, 2022

Filed a patent for "combined modeling and machine learning in optical metrology" on Fri, November 11, 2022

Filed a patent for "dual side simultaneous inspection for integrated circuit substrates" on Wed, November 30, 2022

Filed a patent for "stage actuator particle shield" on Fri, December 2, 2022